Yongkun Li, Patrick P. C. Lee, John C. S. Lui. Stochastic modeling of large-scale solid-state storage systems: analysis, design tradeoffs and optimization. In Mor Harchol-Balter, John R. Douceur, Jun Xu, editors, ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems, SIGMETRICS '13, Pittsburgh, PA, USA, June 17-21, 2013. pages 179-190, ACM, 2013. [doi]
Abstract is missing.