Intelligent Automatic Test Pattern Generation for Digital Circuits Based on Reinforcement Learning - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Wenxing Li, Hongqin Lyu, Shengwen Liang, Tiancheng Wang, Pengyu Tian, Huawei Li 0001. Intelligent Automatic Test Pattern Generation for Digital Circuits Based on Reinforcement Learning. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]

This author has not been identified. Look up 'Wenxing Li' in GoogleThis author has not been identified. Look up 'Hongqin Lyu' in GoogleThis author has not been identified. Look up 'Shengwen Liang' in GoogleThis author has not been identified. Look up 'Tiancheng Wang' in GoogleThis author has not been identified. Look up 'Pengyu Tian' in GoogleThis author has not been identified. Look up 'Huawei Li 0001' in Google

runs on WebDSL