Wenxing Li, Hongqin Lyu, Shengwen Liang, Tiancheng Wang, Pengyu Tian, Huawei Li 0001. Intelligent Automatic Test Pattern Generation for Digital Circuits Based on Reinforcement Learning. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.