Tianwen Li, Hongjin Liu, Haigang Yang. Design and Characterization of SEU Hardened Circuits for SRAM-Based FPGA. IEEE Trans. VLSI Syst., 27(6):1276-1283, 2019. [doi]
@article{LiLY19-4,
title = {Design and Characterization of SEU Hardened Circuits for SRAM-Based FPGA},
author = {Tianwen Li and Hongjin Liu and Haigang Yang},
year = {2019},
doi = {10.1109/TVLSI.2019.2892838},
url = {https://doi.org/10.1109/TVLSI.2019.2892838},
researchr = {https://researchr.org/publication/LiLY19-4},
cites = {0},
citedby = {0},
journal = {IEEE Trans. VLSI Syst.},
volume = {27},
number = {6},
pages = {1276-1283},
}