A novel co-design and evaluation methodology for ESD protection in RFIC

Li Li, Hongxia Liu, Zhaonian Yang, Linlin Chen. A novel co-design and evaluation methodology for ESD protection in RFIC. Microelectronics Reliability, 52(11):2632-2639, 2012. [doi]

Authors

Li Li

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Hongxia Liu

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Zhaonian Yang

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Linlin Chen

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