Li Li, Hongxia Liu, Zhaonian Yang, Linlin Chen. A novel co-design and evaluation methodology for ESD protection in RFIC. Microelectronics Reliability, 52(11):2632-2639, 2012. [doi]
@article{LiLYC12,
title = {A novel co-design and evaluation methodology for ESD protection in RFIC},
author = {Li Li and Hongxia Liu and Zhaonian Yang and Linlin Chen},
year = {2012},
doi = {10.1016/j.microrel.2012.06.003},
url = {http://dx.doi.org/10.1016/j.microrel.2012.06.003},
researchr = {https://researchr.org/publication/LiLYC12},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {52},
number = {11},
pages = {2632-2639},
}