Strong self-testability for data paths high-level synthesis

Xiaowei Li, Toshimitsu Masuzawa, Hideo Fujiwara. Strong self-testability for data paths high-level synthesis. In 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan. pages 229-234, IEEE Computer Society, 2000. [doi]

Abstract

Abstract is missing.