Fabrication and characterization of ultra-thin PIN detector

Ying Li, Shenglin Ma, Yufeng Jin, Min Yu, Lu Zhang, Jinyan Wang. Fabrication and characterization of ultra-thin PIN detector. In 5th IEEE International Conference on Nano/Micro Engineered and Molecular Systems, NEMS 2010, Xiamen, China, January 20-23, 2010. pages 513-517, IEEE, 2010. [doi]

Abstract

Abstract is missing.