Yu Li, Terrence S. T. Mak, Alex Yakovlev. Redressing timing issues for speed-independent circuits in deep submicron age. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 1376-1381, IEEE, 2011. [doi]
@inproceedings{LiMY11-1,
title = {Redressing timing issues for speed-independent circuits in deep submicron age},
author = {Yu Li and Terrence S. T. Mak and Alex Yakovlev},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763222},
researchr = {https://researchr.org/publication/LiMY11-1},
cites = {0},
citedby = {0},
pages = {1376-1381},
booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
publisher = {IEEE},
isbn = {978-1-61284-208-0},
}