Meng Li, Heng-nian, Yaoxin Wang, Dan Sun, Haipan Li, Han Li. Over-Modulation Risk Evaluation Method in Impedance Measurement for Peak-Value Constrain. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.