Pattern classification using a new border identification paradigm: The nearest border technique

Yifeng Li, B. John Oommen, Alioune Ngom, Luis Rueda. Pattern classification using a new border identification paradigm: The nearest border technique. Neurocomputing, 157:105-117, 2015. [doi]

Authors

Yifeng Li

This author has not been identified. Look up 'Yifeng Li' in Google

B. John Oommen

This author has not been identified. Look up 'B. John Oommen' in Google

Alioune Ngom

This author has not been identified. Look up 'Alioune Ngom' in Google

Luis Rueda

This author has not been identified. Look up 'Luis Rueda' in Google