Pattern classification using a new border identification paradigm: The nearest border technique

Yifeng Li, B. John Oommen, Alioune Ngom, Luis Rueda. Pattern classification using a new border identification paradigm: The nearest border technique. Neurocomputing, 157:105-117, 2015. [doi]

@article{LiONR15,
  title = {Pattern classification using a new border identification paradigm: The nearest border technique},
  author = {Yifeng Li and B. John Oommen and Alioune Ngom and Luis Rueda},
  year = {2015},
  doi = {10.1016/j.neucom.2015.01.030},
  url = {http://dx.doi.org/10.1016/j.neucom.2015.01.030},
  researchr = {https://researchr.org/publication/LiONR15},
  cites = {0},
  citedby = {0},
  journal = {Neurocomputing},
  volume = {157},
  pages = {105-117},
}