Multi-level EDT to Reduce Scan Channels in SoC Designs

Guoliang Li, Jun Qian, Peter Li, Greg Zuo. Multi-level EDT to Reduce Scan Channels in SoC Designs. In 21st IEEE Asian Test Symposium, ATS 2012, Niigata, Japan, November 19-22, 2012. pages 77-82, IEEE Computer Society, 2012. [doi]

Authors

Guoliang Li

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Jun Qian

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Peter Li

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Greg Zuo

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