Guoliang Li, Jun Qian, Qinfu Yang, Yuan Zuo, Rui Li, Yu Huang, Mark Kassab, Janusz Rajski. Hybrid Hierarchical and Modular Tests for SoC Designs. In 24th IEEE North Atlantic Test Workshop, NATW 2015, Johnson City, NY, USA, May 11-13, 2015. pages 11-16, IEEE, 2015. [doi]
Abstract is missing.