Automated Test Data Generation Algorithm Based On Reversed Binary Tree

Junyi Li, Jiaguang Sun. Automated Test Data Generation Algorithm Based On Reversed Binary Tree. In Wenying Feng, Feng Gao, editors, Proceedings of the 8th ACIS International Conference on Software Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing, SNPD 2007, July 30 - August 1, 2007, Qingdao, China. pages 1124-1128, IEEE Computer Society, 2007. [doi]

Abstract

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