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Automatically Identifying Relations Between Self-Admitted Technical Debt Across Different Sources

Yikun Li, Mohamed Soliman, Paris Avgeriou. Automatically Identifying Relations Between Self-Admitted Technical Debt Across Different Sources. In 2023 ACM/IEEE International Conference on Technical Debt (TechDebt), Melbourne, Australia, May 14-15, 2023. pages 11-21, IEEE, 2023. [doi]

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