Leakage-Resilience of Circuit Garbling

Ruiyang Li, Yiteng Sun, Chun Guo 0002, François-Xavier Standaert, Weijia Wang 0003, Xiao Wang 0012. Leakage-Resilience of Circuit Garbling. IACR Cryptology ePrint Archive, 2024:1356, 2024. [doi]

Abstract

Abstract is missing.