Operating System Mechanisms for TPM-Based Lifetime Measurement of Process Integrity - researchr publication authors

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Xiao Li, Wenchang Shi, Zhaohui Liang, Bin Liang, Zhiyong Shan. Operating System Mechanisms for TPM-Based Lifetime Measurement of Process Integrity. In IEEE 6th International Conference on Mobile Adhoc and Sensor Systems, MASS 2009, 12-15 October 2009, Macau (S.A.R.), China. pages 783-789, IEEE, 2009. [doi]

This author has not been identified. Look up 'Xiao Li' in GoogleThis author has not been identified. Look up 'Wenchang Shi' in GoogleThis author has not been identified. Look up 'Zhaohui Liang' in GoogleThis author has not been identified. Look up 'Bin Liang' in GoogleThis author has not been identified. Look up 'Zhiyong Shan' in Google

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