Stan Z. Li, Ben A. M. Schouten, Massimo Tistarelli. Biometrics at a Distance: Issues, Challenges, and Prospects. In Massimo Tistarelli, Stan Z. Li, Rama Chellappa, editors, Handbook of Remote Biometrics. Advances in Pattern Recognition, pages 3-21, Springer, 2009. [doi]
Abstract is missing.