Next-Generation Consumer Electronics Data Auditing Scheme Toward Cloud-Edge Distributed and Resilient Machine Learning - researchr publication

researchr

You are not signed in
Sign in
Sign up

Yi Li, Jian Shen 0001, Pandi Vijayakumar, Chin-Feng Lai, Audithan Sivaraman, Pradip Kumar Sharma. Next-Generation Consumer Electronics Data Auditing Scheme Toward Cloud-Edge Distributed and Resilient Machine Learning. IEEE Trans. Consumer Electronics, 70(1):2244-2256, February 2024. [doi]

Abstract is missing.

runs on WebDSL