A Scenario-Based Approach to Predicting Software Defects Using Compressed C4.5 Model

Biwen Li, Beijun Shen, Jun Wang, Yuting Chen, Tao Zhang, Jinshuang Wang. A Scenario-Based Approach to Predicting Software Defects Using Compressed C4.5 Model. In IEEE 38th Annual Computer Software and Applications Conference, COMPSAC 2014, Vasteras, Sweden, July 21-25, 2014. pages 406-415, IEEE, 2014. [doi]

Abstract

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