Min Li, Zhengyuan Shi, Zezhong Wang, Weiwei Zhang, Yu Huang, Qiang Xu. Testability-Aware Low Power Controller Design with Evolutionary Learning. In IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021. pages 324-328, IEEE, 2021. [doi]
@inproceedings{LiSWZHX21,
title = {Testability-Aware Low Power Controller Design with Evolutionary Learning},
author = {Min Li and Zhengyuan Shi and Zezhong Wang and Weiwei Zhang and Yu Huang and Qiang Xu},
year = {2021},
doi = {10.1109/ITC50571.2021.00046},
url = {https://doi.org/10.1109/ITC50571.2021.00046},
researchr = {https://researchr.org/publication/LiSWZHX21},
cites = {0},
citedby = {0},
pages = {324-328},
booktitle = {IEEE International Test Conference, ITC 2021, Anaheim, CA, USA, October 10-15, 2021},
publisher = {IEEE},
isbn = {978-1-6654-1695-5},
}