Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao 0003, Xiangning He, Nick Wright. AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. IEEE Transactions on Industrial Electronics, 66(10):8197-8204, 2019. [doi]
@article{LiTCTLLGHW19,
title = {AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer},
author = {Kongjing Li and Gui Yun Tian and Xiaotian Chen and Chaoqing Tang and Haoze Luo and Wuhua Li and Bin Gao 0003 and Xiangning He and Nick Wright},
year = {2019},
doi = {10.1109/TIE.2018.2886775},
url = {https://doi.org/10.1109/TIE.2018.2886775},
researchr = {https://researchr.org/publication/LiTCTLLGHW19},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Industrial Electronics},
volume = {66},
number = {10},
pages = {8197-8204},
}