Kongjing Li, Gui Yun Tian, Xiaotian Chen, Chaoqing Tang, Haoze Luo, Wuhua Li, Bin Gao 0003, Xiangning He, Nick Wright. AR-Aided Smart Sensing for In-Line Condition Monitoring of IGBT Wafer. IEEE Transactions on Industrial Electronics, 66(10):8197-8204, 2019. [doi]
Abstract is missing.