Chi Chung Li, Joseph Toombs, Hayden Taylor. Tomographic color Schlieren refractive index mapping for computed axial lithography. In Emily Whiting, John Hart, Cynthia Sung 0001, Nadya Peek, Masoud Akbarzadeh, Daniel Aukes, Adriana Schulz, Hayden Taylor, Jeeeun Kim, editors, SCF '20: Symposium on Computational Fabrication, Virtual Event, USA, November 5-6, 2020. ACM, 2020. [doi]
Abstract is missing.