Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey. An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 574-579, IEEE Computer Society, 2005. [doi]
@inproceedings{LiTW05:0,
title = {An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories},
author = {Jin-Fu Li and Tsu-Wei Tseng and Chin-Long Wey},
year = {2005},
doi = {10.1109/DATE.2005.56},
url = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.56},
tags = {testing},
researchr = {https://researchr.org/publication/LiTW05%3A0},
cites = {0},
citedby = {0},
pages = {574-579},
booktitle = {2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany},
publisher = {IEEE Computer Society},
isbn = {0-7695-2288-2},
}