Jin-Fu Li, Tsu-Wei Tseng, Chin-Long Wey. An Efficient Transparent Test Scheme for Embedded Word-Oriented Memories. In 2005 Design, Automation and Test in Europe Conference and Exposition (DATE 2005), 7-11 March 2005, Munich, Germany. pages 574-579, IEEE Computer Society, 2005. [doi]
Abstract is missing.