Yudong Li, Bo Tang, Jiang Yan. A simulation analysis of back gate effects for FDSOI devices. In 2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{LiTY15-2, title = {A simulation analysis of back gate effects for FDSOI devices}, author = {Yudong Li and Bo Tang and Jiang Yan}, year = {2015}, doi = {10.1109/ASICON.2015.7517064}, url = {https://doi.org/10.1109/ASICON.2015.7517064}, researchr = {https://researchr.org/publication/LiTY15-2}, cites = {0}, citedby = {0}, pages = {1-4}, booktitle = {2015 IEEE 11th International Conference on ASIC, ASICON 2015, Chengdu, China, November 3-6, 2015}, publisher = {IEEE}, isbn = {978-1-4799-8485-5}, }