Xiaojun Li, Joerg D. Walter, Joseph B. Bernstein. Simulating and Improving Microelectronic Device Reliability by Scaling Voltage and Temperature. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 496-502, IEEE Computer Society, 2005. [doi]
Abstract is missing.