Jing Li, Wensheng Wei, Yuxing Dai. Sensitivities of Bilayer Graphene FET Performance to Bipolar Characteristics. In Third International Conference on Digital Manufacturing & Automation, ICDMA 2012, Guilin, China, July 31 - Aug. 2, 2012. pages 763-766, IEEE, 2012. [doi]
@inproceedings{LiWD12-1,
title = {Sensitivities of Bilayer Graphene FET Performance to Bipolar Characteristics},
author = {Jing Li and Wensheng Wei and Yuxing Dai},
year = {2012},
doi = {10.1109/ICDMA.2012.180},
url = {http://doi.ieeecomputersociety.org/10.1109/ICDMA.2012.180},
researchr = {https://researchr.org/publication/LiWD12-1},
cites = {0},
citedby = {0},
pages = {763-766},
booktitle = {Third International Conference on Digital Manufacturing & Automation, ICDMA 2012, Guilin, China, July 31 - Aug. 2, 2012},
publisher = {IEEE},
isbn = {978-1-4673-2217-1},
}