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Genetic Algorithm-based Test Generation for Software Product Line with the Integration of Fault Localization Techniques

Xue-Lin Li, W. Eric Wong, Ruizhi Gao, Linghuan Hu, Shigeru Hosono. Genetic Algorithm-based Test Generation for Software Product Line with the Integration of Fault Localization Techniques. Empirical Software Engineering, 23(1):1-51, 2018. [doi]

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