The total ionizing dose response of a DSOI 4Kb SRAM

B. Li, J. Wu, J. Gao, Y. Kuang, J. Li, X. Zhao, K. Zhao, Z. Han, J. Luo. The total ionizing dose response of a DSOI 4Kb SRAM. Microelectronics Reliability, 76:714-718, 2017. [doi]

Authors

B. Li

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J. Wu

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J. Gao

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Y. Kuang

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J. Li

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X. Zhao

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K. Zhao

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Z. Han

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J. Luo

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