Zhan Li, Yuxi Wang, Hao Ma, Liang Hong. Open-transistor faults diagnosis in voltage-source inverter based on phase voltages with sliding-window counting method. In IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society, Florence, Italy, October 23-26, 2016. pages 435-440, IEEE, 2016. [doi]
Abstract is missing.