Revisiting Local Descriptor Based Image-To-Class Measure for Few-Shot Learning - researchr publication

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Wenbin Li, Lei Wang, Jinglin Xu, Jing Huo, Yang Gao, Jiebo Luo. Revisiting Local Descriptor Based Image-To-Class Measure for Few-Shot Learning. In IEEE Conference on Computer Vision and Pattern Recognition, CVPR 2019, Long Beach, CA, USA, June 16-20, 2019. pages 7260-7268, Computer Vision Foundation / IEEE, 2019. [doi]

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