An Automatically-Generated Run-Time Instrumenter to Reduce Coverage Testing Overhead

J. Jenny Li, David M. Weiss, Howell Yee. An Automatically-Generated Run-Time Instrumenter to Reduce Coverage Testing Overhead. In Hong Zhu, W. Eric Wong, Fevzi Belli, editors, Proceedings of the 3rd International Workshop on Automation of Software Test, AST 2008, Leipzig, Germany, May 11-11, 2008. pages 49-56, ACM, 2008. [doi]

Abstract

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