Wen Li, Ying Wang 0001, Kaiwei Zou, Huawei Li 0001, Xiaowei Li 0001. Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors. In 32nd IEEE Asian Test Symposium, ATS 2023, Beijing, China, October 14-17, 2023. pages 1-6, IEEE, 2023. [doi]
Abstract is missing.