Hong Li 0002, YuTing Wang, Xingran Zhao, Kai Sun, Zhe Zhou, Yunfei Xu. A Junction Temperature-based PSpice Short-circuit Model of SiC MOSFET Considering Leakage Current. In IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society, Lisbon, Portugal, October 14-17, 2019. pages 5095-5100, IEEE, 2019. [doi]
Abstract is missing.