Weiguo Li, Yunfei Xu, Qingping Li, Yi Hao, Guoliang Zhao, Haijun Liu. Behavior Modeling and Analysis of High-Voltage SiC MOSFET Considering Temperature Effect. In 49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023. pages 1-7, IEEE, 2023. [doi]
@inproceedings{LiXLHZL23,
title = {Behavior Modeling and Analysis of High-Voltage SiC MOSFET Considering Temperature Effect},
author = {Weiguo Li and Yunfei Xu and Qingping Li and Yi Hao and Guoliang Zhao and Haijun Liu},
year = {2023},
doi = {10.1109/IECON51785.2023.10311758},
url = {https://doi.org/10.1109/IECON51785.2023.10311758},
researchr = {https://researchr.org/publication/LiXLHZL23},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {49th Annual Conference of the IEEE Industrial Electronics Society, IECON 2023, Singapore, October 16-19, 2023},
publisher = {IEEE},
isbn = {979-8-3503-3182-0},
}