Liran Li, Pengcheng Xiao, Zhenhai Lu, Yubo Wang, Yi Hu, Yuan Guan, Kun Wang, Dameng Li, Fan Zhang. Testing and trimming methods of high-resolution and large swing for ADC based on ATE. In Fan Ye, Ting-Ao Tang, editors, 14th IEEE International Conference on ASIC, ASICON 2021, Kunming, China, October 26-29, 2021. pages 1-4, IEEE, 2021. [doi]
Abstract is missing.