A new connected device-based Failure Mode and Effects Analysis model

Jinfeng Li, Chen Xuan, Bing Shao, Hao Ji, Changrui Ren. A new connected device-based Failure Mode and Effects Analysis model. In Proceedings of 2014 IEEE International Conference on Service Operations and Logistics, and Informatics, Qingdao, China, October 8-10, 2014. pages 1-5, IEEE, 2014. [doi]

Abstract

Abstract is missing.