An Analytical Model for doping effect in charge-plasma-based TFET

Wenbo Li, Qian Xie, Zheng Wang. An Analytical Model for doping effect in charge-plasma-based TFET. In 2022 IEEE International Conference on Integrated Circuits, Technologies and Applications, ICTA 2022, Xi'an, China, October 28-30, 2022. pages 186-187, IEEE, 2022. [doi]

Abstract

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