A Thermal Failure Model for MOSFETs Under Repetitive Electromagnetic Pulses

Yong Li, Haiyan Xie, Hui Yan, Jianguo Wang 0004, Zhiqiang Yang. A Thermal Failure Model for MOSFETs Under Repetitive Electromagnetic Pulses. IEEE Access, 8:228245-228254, 2020. [doi]

Abstract

Abstract is missing.