Rui Li, Bin Xue, Kun Zhao, Huihui Chu, Benshuang Jiao. PCB Defect Recognition and Elimination Based on Secondary Error and Statistical Histogram. In 16th International Wireless Communications and Mobile Computing Conference, IWCMC 2020, Limassol, Cyprus, June 15-19, 2020. pages 1981-1984, IEEE, 2020. [doi]
Abstract is missing.