Tao Li, Zhiping Yu. Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage. In Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007. pages 99-102, IEEE, 2007. [doi]
@inproceedings{LiY07:21,
title = {Statistical Analysis of Full-Chip Leakage Power Considering Junction Tunneling Leakage},
author = {Tao Li and Zhiping Yu},
year = {2007},
doi = {10.1109/DAC.2007.375132},
url = {http://doi.ieeecomputersociety.org/10.1109/DAC.2007.375132},
tags = {analysis},
researchr = {https://researchr.org/publication/LiY07%3A21},
cites = {0},
citedby = {0},
pages = {99-102},
booktitle = {Proceedings of the 44th Design Automation Conference, DAC 2007, San Diego, CA, USA, June 4-8, 2007},
publisher = {IEEE},
}