Xue-jing Li, Dan Yu. A reliability integrated acceptance test plan for series systems whose components following exponential distributions. In 2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011, Beijing, China, 10-12 July, 2011. pages 339-344, IEEE, 2011. [doi]
@inproceedings{LiY11-17,
title = {A reliability integrated acceptance test plan for series systems whose components following exponential distributions},
author = {Xue-jing Li and Dan Yu},
year = {2011},
doi = {10.1109/ISI.2011.5984110},
url = {http://dx.doi.org/10.1109/ISI.2011.5984110},
researchr = {https://researchr.org/publication/LiY11-17},
cites = {0},
citedby = {0},
pages = {339-344},
booktitle = {2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011, Beijing, China, 10-12 July, 2011},
publisher = {IEEE},
}