How the common retention acceleration method of 3D NAND flash memory goes wrong? - researchr publication authors

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Qiao Li 0001, Min Ye, Tei-Wei Kuo, Chun Jason Xue. How the common retention acceleration method of 3D NAND flash memory goes wrong?. In Philip Shilane, Youjip Won, editors, HotStorage '21: 13th ACM Workshop on Hot Topics in Storage and File Systems, Virtual Event, USA, July 27-28, 2021. pages 1-7, ACM / USENIX Association, 2021. [doi]

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