Qiao Li 0001, Min Ye, Tei-Wei Kuo, Chun Jason Xue. How the common retention acceleration method of 3D NAND flash memory goes wrong?. In Philip Shilane, Youjip Won, editors, HotStorage '21: 13th ACM Workshop on Hot Topics in Storage and File Systems, Virtual Event, USA, July 27-28, 2021. pages 1-7, ACM / USENIX Association, 2021. [doi]
@inproceedings{LiYKX21,
title = {How the common retention acceleration method of 3D NAND flash memory goes wrong?},
author = {Qiao Li 0001 and Min Ye and Tei-Wei Kuo and Chun Jason Xue},
year = {2021},
doi = {10.1145/3465332.3470877},
url = {https://doi.org/10.1145/3465332.3470877},
researchr = {https://researchr.org/publication/LiYKX21},
cites = {0},
citedby = {0},
pages = {1-7},
booktitle = {HotStorage '21: 13th ACM Workshop on Hot Topics in Storage and File Systems, Virtual Event, USA, July 27-28, 2021},
editor = {Philip Shilane and Youjip Won},
publisher = {ACM / USENIX Association},
isbn = {978-1-4503-8550-3},
}