Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design - A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Xiaowei Li, Guihai Yan, Cheng Liu. Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design - A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach. Springer, 2023. [doi]

Abstract

Abstract is missing.