Wenjie Li, Jing Ye, Xiaowei Li, Huawei Li, Yu Hu. Bias PUF based Secure Scan Chain Design. In Asian Hardware Oriented Security and Trust Symposium, AsianHOST 2018, Hong Kong, China, December 17-18, 2018. pages 31-36, IEEE, 2018. [doi]
@inproceedings{LiYLLH18,
title = {Bias PUF based Secure Scan Chain Design},
author = {Wenjie Li and Jing Ye and Xiaowei Li and Huawei Li and Yu Hu},
year = {2018},
doi = {10.1109/AsianHOST.2018.8607168},
url = {https://doi.org/10.1109/AsianHOST.2018.8607168},
researchr = {https://researchr.org/publication/LiYLLH18},
cites = {0},
citedby = {0},
pages = {31-36},
booktitle = {Asian Hardware Oriented Security and Trust Symposium, AsianHOST 2018, Hong Kong, China, December 17-18, 2018},
publisher = {IEEE},
isbn = {978-1-5386-7471-0},
}