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Bias PUF based Secure Scan Chain Design

Wenjie Li, Jing Ye, Xiaowei Li, Huawei Li, Yu Hu. Bias PUF based Secure Scan Chain Design. In Asian Hardware Oriented Security and Trust Symposium, AsianHOST 2018, Hong Kong, China, December 17-18, 2018. pages 31-36, IEEE, 2018. [doi]

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